Dependence of Four-Wave Mixing Line-Shape on Micrometric Atomic Vapor Thickness. Journal of Atomic and Molecular Sciences, [S. l.], v. 1, n. 4, p. 337–343, 2010. DOI: 10.4208/jams.060310.072010a. Disponível em: https://global-sci.com/index.php/jams/article/view/14581. Acesso em: 6 dec. 2025.