TY - JOUR
T1 - Orthogonality Sampling Method for Identifying Small Anomalies in Real-World Microwave Imaging
AU - Ahn , Chi Young
AU - Chae , Seongje
AU - Kang , Sangwoo
AU - Lee , Kwang-Jae
AU - Park , Won-Kwang
AU - Son , Seong-Ho
JO - East Asian Journal on Applied Mathematics
VL - 2
SP - 293
EP - 313
PY - 2024
DA - 2024/04
SN - 14
DO - http://doi.org/10.4208/eajam.2022-318.170723
UR - https://global-sci.org/intro/article_detail/eajam/23064.html
KW - Orthogonality sampling method, microwave imaging, infinite series of Bessel functions, real-data experiment.
AB - <p style="text-align: justify;">In this paper, the application of the orthogonality sampling method (OSM)
to the real-world microwave imaging for identifying location of small anomalies is addressed. In order to show the feasibility and limitation of the OSM, we theoretically
prove that the indicator function can be represented in terms of an infinite series of
Bessel functions of integer order and the transmitting and receiving signal antenna configurations. This is based on the application of the Born approximation and the reciprocity of the incident fields. Throughout real-data experiments, it was shown that the
OSM works well for identifying single anomaly under the specific location of transmitter while further improvement is needed for identification of multiple anomalies. To
improve the imaging performance, we consider traditional indicator function with multiple sources and design a new indicator function with multiple sources weighted by the
incident field. Theoretical results are contained to demonstrate the improvement.</p>