Dependence of Four-Wave Mixing Line-Shape on Micrometric Atomic Vapor Thickness

Dependence of Four-Wave Mixing Line-Shape on Micrometric Atomic Vapor Thickness

Year:    2010

Author:    Li Li, Yi-Xin Lu, Yuan-Yuan Li

Journal of Atomic and Molecular Sciences, Vol. 1 (2010), Iss. 4 : pp. 337–343

Abstract

We theoretically examine thickness and wavelength dependence line-shape of four-wave-mixing (FWM) spectroscopy in micrometric thin atomic vapors whose thickness $L$ is assumed to be 10,30,50,80 and 100 $\mu$m respectively. It is found that a narrow centre (Dicke-narrowing) persists for all cases, while wings are broadened as the thickness of the vapor increases or the pump wavelength decreases comparing to the probe wavelength. This type of spectrum is due to the modified velocity distribution and polarization interference from different ensemble of atoms in a confined situation.

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Journal Article Details

Publisher Name:    Global Science Press

Language:    English

DOI:    https://doi.org/10.4208/jams.060310.072010a

Journal of Atomic and Molecular Sciences, Vol. 1 (2010), Iss. 4 : pp. 337–343

Published online:    2010-01

AMS Subject Headings:    Global Science Press

Copyright:    COPYRIGHT: © Global Science Press

Pages:    7

Keywords:    four-wave mixing micrometric atomic vapor Dicke-narrowing polarization interference.

Author Details

Li Li

Yi-Xin Lu

Yuan-Yuan Li