Loading [MathJax]/jax/output/HTML-CSS/config.js
Journals
Resources
About Us
Open Access
Go to previous page

Static Instability of Ultra-Thin Elastic Structures Using Isogeometric Analysis

Static Instability of Ultra-Thin Elastic Structures Using Isogeometric Analysis

Year:    2025

Author:    Tan N. Nguyen

Advances in Applied Mathematics and Mechanics, Vol. 17 (2025), Iss. 3 : pp. 867–887

Abstract

An investigation into postbuckling behavior of thin and ultra-thin plates/shells is first performed in this paper. The present formulation is established upon a shell theory using the von Karman assumption and isogeometric analysis (IGA). In the present approach, the bifurcation point in eigenvalue buckling analysis and limit points can be detected simply via the modified Riks method. Hence, eigenvalue buckling analysis and postbuckling analysis are unified in the most simple flowchart. The above advantages allow buckling and postbuckling analyses of ultra-thin, thin and moderate thick plates/shells can be performed directly and conveniently. The obtained results are verified with the reference ones. In addition, the results show that buckling shapes and postbuckling responses of thin structures and ultra-thin structures are significantly different. Effects of slenderness, aspect ratios and curvature on postbuckling response of ultra-thin plates/shells are investigated particularly. Especially, some new results of ultra-thin plates/shells are first provided in this paper.

You do not have full access to this article.

Already a Subscriber? Sign in as an individual or via your institution

Journal Article Details

Publisher Name:    Global Science Press

Language:    English

DOI:    https://doi.org/10.4208/aamm.OA-2023-0152

Advances in Applied Mathematics and Mechanics, Vol. 17 (2025), Iss. 3 : pp. 867–887

Published online:    2025-01

AMS Subject Headings:    Global Science Press

Copyright:    COPYRIGHT: © Global Science Press

Pages:    21

Keywords:    Isogeometric analysis postbuckling ultra-thin plates shells.

Author Details

Tan N. Nguyen Email