Geometric Evolution Laws for Thin Crystalline Films: Modeling and Numerics

Year:    2009

Communications in Computational Physics, Vol. 6 (2009), Iss. 3 : pp. 433–482

Abstract

Geometrical evolution laws are widely used in continuum modeling of surface and interface motion in materials science. In this article, we first give a brief review of various kinds of geometrical evolution laws and their variational derivations, with an emphasis on strong anisotropy. We then survey some of the finite element based numerical methods for simulating the motion of interfaces focusing on the field of thin film growth. We discuss the finite element method applied to front-tracking, phase-field and level-set methods. We describe various applications of these geometrical evolution laws to materials science problems, and in particular, the growth and morphologies of thin crystalline films.

Journal Article Details

Publisher Name:    Global Science Press

Language:    English

DOI:    https://doi.org/2009-CiCP-7688

Communications in Computational Physics, Vol. 6 (2009), Iss. 3 : pp. 433–482

Published online:    2009-01

AMS Subject Headings:    Global Science Press

Copyright:    COPYRIGHT: © Global Science Press

Pages:    50

Keywords: